Location: Upton, NY
Cap-Exempt H-1B Position — No lottery required
The Imaging and Microscopy Program at BNL’s National Synchrotron Light Source II (NSLS-II) offers world-class capabilities for imaging complex and heterogeneous materials with diverse imaging modalities at multiple length scales. The Imaging and Microscopy Program operates four beamlines (FXI, HXN, SRX, CDI) with strong general user programs and is constructing the SXN beamline. FXI and HXN are nanoscale resolution beamlines offering full-field and scanning imaging capabilities, respectively. SRX is a hard X-ray scanning probe with a sub-micron focus to bridge the spatial resolution gap between nano- and micro-probes. CDI is a coherent diffractive imaging beamline with a high degree of specialization for Bragg CDI, and SXN is a soft x-ray nanoprobe with spectromicroscopy and ptychography imaging. Members of the Imaging and Microscopy Program share common tools and resources and engage in strong inter-beamline collaboration. **Position Description** The National Synchrotron Light Source II (NSLS-II) is seeking a beamline scientist to join the Imaging and Microscopy Program. The successful candidate will contribute to the advancement of sub-micron x-ray imaging techniques. Stationed at the Submicron Resolution X-ray spectroscopy (SRX) beamline, the candidate will leverage its sub-micron spatial resolution and multimodal capabilities to conduct cutting-edge research. The SRX beamline is a hard X-ray fluorescence nanoprobe with significant spectroscopy capabilities that delivers a sub-micron focused beam over a wide range of complex samples. The diverse user community studies samples ranging from energy and materials science to biology and Earth and environmental sciences. Using the SRX beamline, researchers hope to better understand their systems using the high-resolution, high-flux fluorescence nanoprobe to mainly collect 2D elemental maps and point spectroscopy. The beamline is not limited to these techniques and more advanced users utilize 2D XANES imaging and 3D X-