Location: Gaithersburg, MD
Cap-Exempt H-1B Position — No lottery required
**Requisition #:** A-185484-26 **School:** Whiting School of Engineering **Location:** Gaithersburg, MD **Position Type:** Postdoctoral Fellowship **Shift Type:** Full Time **Salary Range:** $89,000 **Closing Date:** Open until filled **To apply:** https://dossier.interfolio.com/apply/185484 **General Description** **PREP Research Associate** **CHIPS Funded Project** This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). NIST recognizes that its research staff may want to collaborate with researchers at academic institutions on specific projects of mutual interest and, therefore, requires those institutions to be recipients of a PREP award. The PREP program involves staff from a wide range of backgrounds conducting scientific research across various fields. Individuals in this position will perform technical work supporting the collaboration's scientific research. **Research Title:** HR-EBSD/HR-TKD Strain Measurement for Semiconductor Devices (U.S. Citizen Preferred) **The work will entail:** The Materials Measurement Laboratory of the National Institute of Standards and Technology is seeking qualified persons (U.S. Citizens Preferred) to join a multi-disciplinary team of scientists working to advance the current state-of-the-art in strain measurement methods for semiconductor devices and packages. The candidate will operate a first-of-its-kind Electron Backscatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD) detector, create samples using Focused Ion Beam (FIB) instruments, and perform innovative data processing using both commercial and custom developed tools. Collaboration externally with semiconductor entities, detector manufacturers, and analysis software vendors, as well as internally at NIST with Transmission Electron Microscopy (TEM) aspects of the project are critical to success. **Key responsibilities will include but are not limited to:** - Operating a scanning e