Location: Oak Ridge, TN
Cap-Exempt H-1B Position — No lottery required
Requisition Id 16161 **Overview:** We are seeking a Postdoctoral Research Associate who will focus on advanced scanning probe microscopy to study the dynamics of ferroic systems, including ferroelectric and ferroelastic materials, under external stimuli such as electric fields, light, strain, and temperature. This position resides in the Data Nanonanalytics (DNA) Group within the Nanomaterials Characterization Section of the Center for Nanophase Materials Sciences (CNMS), Physical Sciences Directorate (PSD) at Oak Ridge National Laboratory (ORNL). As part of our research team, you will investigate the functional properties of novel ferroic material systems and correlate their nanoscale ferroelectric, ferroelastic, optical, and electrical responses with structure and environment, with relevance to microelectronic devices and low-power, three-dimensional, non-von Neumann computing architectures. You will utilize ORNL’s unique ultra-high-vacuum, glovebox, and ambient atomic force microscopy capabilities, together with band-excitation and internally developed modalities, to probe environmental- and temperature-dependent behavior and to develop new scanning probe techniques aimed at discovering underlying physical mechanisms. A particular focus will be on the dynamics of topological structures such as ferroelectric and ferroelastic domains and domain walls, as well as on understanding the nanoscale behavior of emerging ferroelectrics, including wurtzite- and fluorite-structured materials, through advanced measurement approaches and multidimensional data analysis. You will play an integral role in atomic force microscopy research and collaborate closely with scientists across ORNL in materials synthesis, device fabrication, theory, and complementary characterization. **Major Duties/Responsibilities:** - Conduct materials research using atomic force microscopy - Work as part of a dynamic team conducting research that advances and develops cutting-edge characterization capa